Description
42N/m, 320kHz, Asymmetric Tip, Al Reflex Coating, 10-Pack DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries. Specifications: – 42 N/m, 320 kHz, 10 nm radius, Al reflex coating. – 10 probes per pack. – Compatible with most commercially available AFMs. High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 5:1 at 1um from tip apex. Tip Geometry:
High Aspect Ratio Tip Height:
10 – 15 Front Angle:
5 ± 0.5 Back Angle:
5 ± 0.5 Side Angle:
5 ± 0.5 Tip Radius (Nom):
10 Tip Radius (Max):
15 Tip Set Back (Nom):
15 Tip Set Back( RNG):
5 – 25 Tilt Compensation:
12 Cantilever Material:
0.01 – 0.025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom):
4 Cantilever Thickness (RNG):
3.5 – 4.5 Cantilever Geometry:
Rectangular Cantilevers Number:
1 Back Side Coating:
Reflective Aluminum
