Description
Electrical, Contact Mode AFM Probe DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS Electrical, Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as: scanning capacitance microscopy (SCM)
scanning probe lithography
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. AFM Tip SHAPE
Rotated Tip Height
17µm From 15µm To 19µm Tip Setback
15µm From 10µm To 20µm Tip Radius < 25nm Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Shape
Beam Force Constant
0.2N/m – From 0.07N/m To 0.4N/m Resonance Frequency
13kHz – From 9kHz To 17kHz Length 450µm – From 440µm To 460µm Width 50µm – From 45µm To 55µm Thickness 2µm – From 1µm To 3µm
