Description
DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs compatible with 3.2mm pin stub holder bulk or irregularly shaped specimens up to 25mm or 1″ Accepts up to 25mm (1″) diameter metallurgical mounts. Material: machined aluminum with stainless steel allen set screws. Allen wrench included. Holder size is Ø31.5 x 11mm. crew used is 6-32 x 1/2, Hex Set, SS 15305 may be used for bulk specimens (left) or metallurgical mounts (right)
